Thoughts on Ultra High Vacuum Scanning Probe Microscope
نویسندگان
چکیده
منابع مشابه
Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices
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ژورنال
عنوان ژورنال: Hyomen Kagaku
سال: 2017
ISSN: 0388-5321,1881-4743
DOI: 10.1380/jsssj.38.493